Comparative Studies on Reflection Defect between Textured and Planar Surface Based on TCO Materials

Diaw, Alassane and Traore, Papa Touty and Dieye, Awa (2022) Comparative Studies on Reflection Defect between Textured and Planar Surface Based on TCO Materials. Energy and Power Engineering, 14 (10). pp. 550-557. ISSN 1949-243X

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Abstract

This article presents, on the one hand, the performance of ARC by configurations ITO/Si, MgO/Si, and GeO2/Si. On the other hand, we study the impact of thickness on the reflection of OCTs, because the thickness of OCTs plays an important role on the optical properties and the variation of the reflection and transmission of TCO/Si heterojunctions as a function of thickness is also sown. And the last part of the paper, we will make a comparative study between the performance of silicon textured on the front side and that of silicon where the front side is planar. These two forms of silicon will be covered with ARC. For this, we will use the following materials ITO, MgO, and GeO2 and we represent the variation of the reflection of CAR on a planar surface and on a textured surface as a function of the wavelength. The results show that the reflection is low in textured surface compare to the planar surface.

Item Type: Article
Subjects: Asian STM > Engineering
Depositing User: Managing Editor
Date Deposited: 12 May 2023 05:29
Last Modified: 13 Jan 2024 04:28
URI: http://journal.send2sub.com/id/eprint/1446

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