ETCHED 4HE-ION TRACKS IN CR-39: TRACK PARAMETERS AND CONSISTENCY CHECKS

Often α-particles and 4He-ions were detected in wide variety of applications by use of SSNTD. Moreover, the investigation of the track revealing by chemical etching is performed with this particle radiation because of their easily availability. Therefore, a tremendous amount of experimental and calculated data for the track revealing were published over more than 40 years in the past. Unfortunately, the comparability of the data is difficult because very different experimental conditions were applied.

The present paper presents a systematic analysis of most recent experimental data of track diameters, track lengths, track etch rates, sensitivity, etch induction time and critical angle. A special aspect of the analysis is the use of constraints to check the consistency and reliability of the experimental data.